Innovative solution for noise and linearity on-wafer calibration process M/F

Job description

General information

Reference

2019-2734  

Job level

30 - Graduate Entry Level

Position description

Posting title

Innovative solution for noise and linearity on-wafer calibration process M/F

Regular/Temporary

Temporary

Job description

Context:

The actual industrial context request the certification of the RF performances with high accuracy and reliability. This certification is provided by a wafer mapping on many wafers. Nowadays test solution exist to characterize Noise and Linearity of RF circuits up to 50 GHz. However the efficiency of the test is limited by the calibration process and the calibration life time.

Objective:

The main objective of the training is the evaluation of innovative solution for the noise and linearity calibration process based on the performances extracted on previous work for noise source and RF power detector integrated on BiCMOS 55 nm platform.

Main Tasks:

The training will first perform a wafer mapping on existing and available wafers, to extract the variation process sensibility on ENR and voltage responsivity of the diode (noise source & RF power detector). Second task will be to select the device with the lowest sensitivity to the variation process. Finally, an on-wafer calibration will be perform and confronted to actual calibration process.

Technology of interest: B55

Profile

- RF and mmW basics: matching Network, Modelisation, Noise, Large signal, S-parameters, Characterization...

- Tools : Keysight ADS, Cadence Virtuoso, Matlab, Excel,

Position localisation

Job location

Europe, France, Crolles

Candidate criteria

Education level required

5 - Master degree

Experience level required

Less than 2 years

Languages

·  French (3- Advanced)
·  English (2- Business fluent)

Requester

Desired start date

03/02/2020